| Number
of Samples |
Silicon
in Sample |
Silicon
on Spore Coat
(% spores) |
Analytical
Method |
Sample Types |
| 28 |
0.01-0.5,
av. 0.14 wt% |
|
ICP-OES |
Miscellaneous |
| 10 |
n.d.B |
|
ICP-OES |
B. cereus |
| 2 |
0.25 wt% |
|
ICP-OES |
Dugway Rev.
Engineered |
| (8) |
artifactC |
n.d.
(2 examined) |
STEM-EDX |
Dugway Rev.
Engineered |
| 6 |
|
1-22% |
STEM-EDX |
Miscellaneous |
| 8 |
0.3 wt.% |
n.d. |
STEM-EDX |
RMR 1029 &
Miscellaneous |
| 55 |
0.002-0.4,
av. 0.03 wt% |
|
NanoSIMS |
Miscellaneous |
| 1 |
|
+ D |
STEM-EDX |
from Stewart 1980 |
Total 118 samples: silicon 0-<0.3 wt% in 107 samples; 0.3-0.5 wt% in 3 samples;
shown to be an artifact in 8 samples.
ABased on data in Table 1, excluding attack samples.
Bn.d. signifies not detected.
CSee text: silicon detected by ICP-OES in 8 Dugway Reverse Engineered samples
has been shown to be a milling artifact.
D+ signifies “detected”. |
