Figure 1: a) The RBS spectrum of TiO2 deposited on monocrystalline silicon. b) AES wide scan spectra of TiO2 thin film surface on PTFE substrate. c) AES wide scan spectra of TiO2 thin film surface on PTFE substrate after ion etch. d) AES in-depth profiling of TiO2 thin film surface on nylon substrate. Observed thin film without any impurities e) AES wide scan spectra of Ag thin film indicator layer on nylon implant model coated by TiO2 thin film. f) SEM image of titanium implant for particles precipitation analysis.