A) STEM analysis includes high-angle annular dark-field scanning transmission electron microscopy (HAADF STEM) images. B) A energy dispersive X-ray spectrum (EDS). EDS analysis has been performed on the AgNPs indicated that the main composition of sample is Ag only. In particular HAADF STEM images show no tendency to aggregate of AgNPs. EDX (left part) were used for point and line profile analyses indicated as [1] in STEM images (right part): comparatively background – no nanoparticles (c, bar=200 nm) vs. two different points showing AgNP (a, b, bar=100 nm). C) Selected STEM images of the AgNP sample (bar=50 nm).
