Sample Film stack (Top-down) MOCVD TiN condition
Growth time Plasma Plasma
Treatment power Treatment time
a ALD W/MOCVD TiN/ ALD TiN/ HfO2/IL/Si sub. 7s 400W 7s
b ALD W/MOCVD TiN/ ALD TiN/ HfO2/IL/Si sub. 15s 400W 7s
c ALD W/MOCVD TiN/ ALD TiN/ HfO2/IL/Si sub. 7s
d ALD W/MOCVD TiN/PVD Ti/ALD TiN/ HfO2/IL/Si sub. 7s 400W 7s
Table 1: Split conditions of HRTEM samples.