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Askari MB | OMICS International
ISSN: 2469-410X

Journal of Lasers, Optics & Photonics
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Askari MB


Study and Calculation Electrical Properties of Silver Thin Layers by Four- Point Probe Method

In this research Ag thin layers on silicon p-type substrate with crystal orientation (100) and 300, 360 and 400 nm thicknesses by thermal evaporation was deposited. Four-point probe and XRD analysis of surface layers consequently for study electrical properties included of sheet resistance, conductivity, resistivity and investigation of Ag phase fo... Read More»

Askari MB, ShahryariM and Nanekarany S

Research Article: J Laser Opt Photonics 2017, 4: 150


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