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Gupta N | OMICS International
ISSN: 2229-8711

Global Journal of Technology and Optimization
Open Access

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Gupta N

USA
Publications

Mitigating the Impact of NBTI and PBTI Degradation

Modern CMOS devices encounter a major problem that alters the threshold voltages of the NMOS and PMOS. Negative Bias Temperature Instability (NBTI) and Positive Bias Temperature Instability (PBTI) are common ageing phenomena observed in PMOS and NMOS devices, respectively. Due to operating temperature and stress time, NBTI and PBTI create a decreas... Read More»

Bairy B, Craig TS, Eshaghian-Wilner MM, Gonde K, Gupta N, Prajogi A and Saligram R

Research Article: Global J Technol Optim 2016, 7: 195

DOI: 10.4172/2229-8711.1000195

Abstract Peer-reviewed Full Article Peer-reviewed Article PDF Mobile Full Article

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