In this work, Indium oxide (In2O3) thin film is successfully deposited on microscopic glass substrate at different temperatures by spray pyrolysis technique using InCl3 as precursor. The physical properties of these films are characterized by XRD, SEM, AFM, FT-IR, FT-Raman, UV-visible and AFM measurements. XRD analysis exposed that the structural transformation of films from stoichiometric to non-stoichiometric orientation of the plane vice versa and also found that, the film is polycrystalline in nature having cubic crystal structure with a preferred grain orientation along (222) plane. SEM and AFM studies revealed that, the film with 0.1M at 500⁰C has spherical grains with uniform dimension. The complete vibrational analysis has been carried out and the optimized parameters are calculated using HF and DFT (CAM-B3LYP, B3LYP and B3PW91) methods with 3-21G (d,p) basis set. Furthermore, NMR chemical shifts are calculated by using the gauge independent atomic orbital (GIAO) technique. The molecular electronic properties; absorption wavelengths, excitation energy, dipole moment and frontier molecular orbital energies, molecular electrostatic potential energy (MEP) analysis and Polarizability first order hyperpolarizability calculations are performed by time dependent DFT (TD-DFT) approach. The energy excitation on electronic structure was investigated and the assignment of the absorption bands in the electronic spectra of steady compound is discussed. The calculated HOMO and LUMO energies showed the enhancement of energy gap by the addition of substitutions with the base molecule. The thermodynamic properties (heat capacity, entropy, and enthalpy) at different temperatures are calculated and interpreted in gas phase.

Citation: Panneerdoss IJ, Jeyakumar SJ, Ramalingam S, Jothibas M (2015) Preparation, Characterization, Spectroscopic (FT-IR, FT-Raman, UV and Visible) Investigation, Optical and Physico Chemical Property Analysis on In2O3 Thin Films. J Theor Comput Sci 2:120. doi: 10.4172/jtco.1000120

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