Analytical Techniques and Instrumentation in Materials Chemistry

Various techniques related to the synthesis of materials to form useful chemical substances constitute the field of analytical study. Instrumental analysis mainly helps us to know the assessment of purity, their chemical composition, structure and function. Analysis of chemical compounds was done to produce results for “what chemicals are present, what are their characteristics and in what quantities are they present?” Basic methods rely on important factors like sample preparation, accuracy, precision and cleanliness. Calibration curves help in the calculation of proper quantities of sample used and also detect the synthesized novel compounds. Certain equipment like electron microscopes, spectrometers, diffractive instruments and so on was employed in the analytical process of a particular synthesis. Scanning electron microscope (SEM) helps in microstructural analysis, fault diagnosis, imaging and elemental analysis of solid materials. Microscopes mostly deal with the same kind of characteristics during the process of synthesis. Mass spectrometer will be majorly availed to detect the masses of individual species within a sample. X-ray diffraction (XRD) deals with the mineralogical analysis of solid materials for phase determination. Rutherford backscattering (RBS) is the major instrument used in the analysis related to the field of materials science and chemistry.

Analytical techniques in the field of materials chemistry propel the development of novel useful chemicals. Effective equipment like SEM, TEM, STEM, AFM, XRD, XPS, SIMS and so on are used to analyse various chemical compounds and thereby producing rapid improvement in the synthesis process. Sensitivity is one of the basic criterion to analyse a chemical compound and also for the purpose of quantification. Proper instrumentation should be used in order to achieve quantifying ultra-low concentration substances and also elucidating the accurate chemical structures.

  • Scanning and transmission electron microscopy (SEM, TEM, STEM)
  • Atomic force microscopy (AFM)
  • Optical spectroscopy
  • X-ray diffraction (XRD)
  • X-ray photoelectron spectroscopy (XPS)
  • Secondary ion mass spectrometry (SIMS)
  • Rutherford backscattering
  • Auger electron spectroscopy
  • Elemental analysis
  • Organic analysis
  • Structural analysis

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