X-ray Spectrometry

X-ray Spectrometry is a spectrometer used for measuring the angles of diffraction of X rays produced by reflection from a crystal or for measuring X-ray spectra.X ray spectrometry (XRS) techniques are used for the elemental, chemical, crystalline, structural and dynamic analysis of a broad range of materials fulfilling a wide variety of requirements.
 
These techniques provide exceptional spatial resolution (down to few tens of a nanometre), but can also be used to analyze and produce images of large areas, up to the size of several square meters. Their application is generally not restricted by the physicochemical state of a sample (liquid, frozen or heated) or by other environmental factors since measurements can be performed either in a vacuum or under atmospheric pressure, in specialized experimental chambers or, use optimized portable spectrometers, even in the field.
  • X-ray emission spectroscopy
  • x-ray fluorescence spectrometer
  • Gamma Ray and Neutron Spectrometer (GRNS)

 

X-ray Spectrometry is a spectrometer used for measuring the angles of diffraction of X rays produced by reflection from a crystal or for measuring X-ray spectra.X ray spectrometry (XRS) techniques are used for the elemental, chemical, crystalline, structural and dynamic analysis of a broad range of materials fulfilling a wide variety of requirements.
 
These techniques provide exceptional spatial resolution (down to few tens of a nanometre), but can also be used to analyze and produce images of large areas, up to the size of several square meters. Their application is generally not restricted by the physicochemical state of a sample (liquid, frozen or heated) or by other environmental factors since measurements can be performed either in a vacuum or under atmospheric pressure, in specialized experimental chambers or, use optimized portable spectrometers, even in the field.
  • X-ray emission spectroscopy
  • x-ray fluorescence spectrometer
  • Gamma Ray and Neutron Spectrometer (GRNS)

 

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