Direct Fluorescent Decay Measurements Using High Speed Electronics
- *Corresponding Author:
- Jerrie V. Fairbanks
Department of Electrical and Computer Engineering
University of Arizona
1230 E Speedway Bl. Tucson
AZ 85721, USA
Tel: (520) 621-4025
E-mail: [email protected]
Received Date: July 09, 2012; Accepted Date: July 24, 2012; Published Date: July 28, 2012
Citation: Fairbanks JV, Powers LS, Zhang X, Duncan A, Ramus X (2012) Direct Fluorescent Decay Measurements Using High Speed Electronics. J Biosens Bioelectron S11:003. doi: 10.4172/2155-6210.S11-003
Copyright: © 2012 Fairbanks JV, et al. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
High speed data acquisition architecture is implemented as part of a time-resolved fluorescence detection instrument to directly measure the time course of fluorescent decay. The architecture is implemented using a very fast dynode chain photomultiplier tube and associated gating circuitry, a broad spectrum light emitting diode excitation source, very wide band electronics for amplification and filtering, and a high speed digital oscilloscope. The fluorescence decay of tris (2,2´-bipyridyl) ruthenium (II) is measured and the lifetime measurement is compared with that using other reported methods. The system’s architecture is thereby validated for data acquisition of broadband signals including transient fluorescent recording.