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Imaging via Inverse Scattering Approach and its Resolution | OMICS International | Abstract
ISSN: 2332-0796

Journal of Electrical & Electronic Systems
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Editorial

Imaging via Inverse Scattering Approach and its Resolution

Xudong Chen*

Department of Electrical and Computer Engineering, National University of Singapore, Singapore

*Corresponding Author:
Xudong Chen
Department of Electrical and Computer Engineering
National University of Singapore, Singapore
E-mail: [email protected]

Received Date: January 27, 2012; Accepted Date: January 30, 2012; Published Date: February 02, 2012

Citation: Chen X (2012) Imaging via Inverse Scattering Approach and its Resolution. J Elec Electron 1:e102. doi:10.4172/2167-101X.1000e102

Copyright: © 2012 Chen X. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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