alexa Microstructural, Raman, EPMA and X-ray Tomographic Stud
ISSN: 2381-8719

Journal of Geology & Geophysics
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Research Article

Microstructural, Raman, EPMA and X-ray Tomographic Study of the Odisha's Beryl (Emerald) Sample

Jena PR and Mishra PK*

CSIR-Institute of Minerals and Materials Technology, Odisha, India

Corresponding Author:
Mishra PK
CSIR-Institute of Minerals and Materials Technology
Odisha, India
Tel: 0674 237 9401

Received Date: April 11, 2017; Accepted Date: April 20, 2017; Published Date: April 26, 2017

Citation: Jena PR, Mishra PK (2017) Microstructural, Raman, EPMA and X-ray Tomographic Study of the Odisha's Beryl (Emerald) Sample. J Geol Geophys 6:288. doi: 10.4172/2381-8719.1000288

Copyright: © 2017 Jena PR, et al. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.



This study presents Optical, Microstructural, EPMA and X-ray tomography studies of the chromium-containing Beryl samples of Bangiriposi, Mayurbhanj district of Odisha. The detailed microscopic studies followed by EDAX analysis of different phases revealed the presence of beryllium aluminium silicate as the major matrix with yttrium silicate, Apatite, Albite, Quartz, Zircon, Cordierite and Ferichromite as minor inclusions. Micro-Raman data of the polished surface established the presence of gaseous (CO2, CH4), Water, and other Minerals. Few rare earth (lanthanides) elements such as Ce, Nd, Gd, Y and Sc, along with other transitional elements such as Ti and Zr, Cs are found to be present in these beryl samples. The volume percentage of silicate, phosphate, and oxide, as well as gaseous inclusions, are determined by X-ray tomographic study and are found to be 24%, 3.122% and 6.717% respectively.


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