Observation of Optical Properties of Gold Thin Films Using Spectroscopic EllipsometryPradhan SK*
Department of Physics, National Institute of Technology, Kurukshetra, Haryana, India
- *Corresponding Author:
- Pradhan SK
Department of Physics
National Institute of Technology
Kurukshetra, Haryana-136119, India
E-mail: [email protected]
Received date: November 07, 2016; Accepted date: November 19, 2016; Published date: November 29, 2016
Citation: Pradhan SK (2016) Observation of Optical Properties of Gold Thin Films Using Spectroscopic Ellipsometry. J Material Sci Eng 6:303. doi: 10.4172/2169- 0022.1000303
Copyright: © 2016 Pradhan SK. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
In this research work, an attempt has been made to synthesize nano-structured gold thin films over Silicon dioxide (SiO2) coated on Silicon(Si) Substrate using three deposition techniques namely DC Sputtering, Pulsed DC Sputtering, and Pulsed Laser Deposition(PLD). Optical measurements using spectroscopic ellipsometry showed that the dielectric constants of the films differed between films synthesized by different synthesis routes. This was expected because different synthesis routes yielded different microstructure. The difference in microstructures results in differences in electronic structure and therefore resulting in the differences on the optical response.