alexa Signature Anaysis For Small Delay Defect Detection Delay Measurement Techniques
ISSN ONLINE(2319-8753)PRINT(2347-6710)

International Journal of Innovative Research in Science, Engineering and Technology
Open Access

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Special Issue Article

Signature Anaysis For Small Delay Defect Detection Delay Measurement Techniques

Ananda S.Paymode.Dnyaneshwar K.Padol. Santosh B.Lukare.
  1. Asst. Professor, Dept. of E & TC, LGNSCOE,Nashik,UO Pune, MaharashtraIndia India.
  2. Asst. Professor, Dept. of E & TC, LGNSCOE,Nashik,UO Pune, MaharashtraIndia India.
  3. Asst. Professor, Dept. of Instrument & control system,MVPSSKBTCOE, Nashik,UO Pune, Maharashtra, India.
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Abstract

This paper presents a delay measurement technique using signature analysis, and a scan design for the proposed delay measurement technique to detect small-delay defects. The proposed measurement technique measures the delay of the explicitly sensitized paths with the resolution of the on-chip variable clock generator. The proposed scan design realizes complete on-chip delay measurement in short measurement time using the proposed delay measurement technique and extra latches for storing the test vectors. The evaluation with Rohm 0.18- m process shows that the measurement time is 67.8% reduced compared with that of the delay measurement with standard scan design on average. The area overhead is 23.4% larger than that of the delay measurement architecture using standard scan design and the difference of the area overhead between enhanced scan design and the proposed method is 7.4% on average. The data volume is 2.2 times of that of test set for normal testing on average.

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