alexa AFM And SIMS Surface And Cation Profile Investigation Of Archaeological Obsidians: New Data | 61237
ISSN: 2157-7064

Journal of Chromatography & Separation Techniques
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3rd International Conference on Mass Spectrometry

Ioannis Liritzis, Massimo Bonini, Francesca Ridi, Reinhard Kersting, Fahad Al-Otaibi and Nick Laskaris
University of the Aegean, Greece
King Saud University, Saudi Arabia
Technological Educational Institute of Ionian Islands, Greece
University of Florence, Italy
Tascon GmbH, Germany
Posters & Accepted Abstracts: J Chromatogr Sep Tech
DOI: 10.4172/2157-7064.C1.023
Abstract
SIMS (secondary ion mass spectroscopy) of hydrogen profiles is used for obsidian hydration dating (OHD). Obsidian surface roughness and rind structure both play a major influence on the OHD by H+ SIMS profiles (SIMS-surface saturation dating method). AFM (atomic force microscopy) investigation coupled with quadrupole-SIMS hydrogen data profiles established a validation criterion of quantitative evaluation of roughness for OHD dating purposes. More evidence of the importance of the surface morphology at the nano-scale was given for five obsidian tools of different origin. The latter relates to the dynamic ion influx diffusion kinetics between surface and surrounded sediment media, and the obsidian structure, thus, 2D and 3D surface mapping, as well as, cation profiling (C, Mg, Al and F) were made by TOF-SIMS and quad-SIMS. It was found that the C and Mg are considered as imposed criteria for accepting suitability of hydrogen profiles for further processing by SIMS-SS. The effect of roughness to dating was discussed.
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