Advancements in Genetic Engineering
Open Access

Overview of low level presence of unapproved genetically engineered traits and their detection using DNA-based method

International Conference on Genetic Engineering & Genetically Modified Organisms

August 12-13, 2013 DoubleTree by Hilton, Raleigh, NC, USA

Tigst Demeke

Scientific Tracks Abstracts: Adv Genet Eng

Abstract :

Low level presence (LLP) is the unintended presence of trace level of genetically engineered (GE) crop that has received regulatory approval for commercial use or sale in one or more countries, but has not been authorized in an importing country. Some countries have zero tolerance policy for unapproved GE events. There are a few cases of LLP of unapproved GE events that have affected international grain trade. The challenge of handling LLP of GE materials could even be greater as a result of the increase of biotech crop events in the future. Scenarios for minimizing LLP of GE events will be presented. Polymerase chain reaction (PCR) is the most commonly used method for detection of GE events. Event-specific PCR method has been widely used for detection and quantification of GE events. Reliable quantification of GE events below 0.1% (w/w) could pose a challenge. Available information on using DNA-based methods for detection of trace levels of GE events will be reviewed.

Biography :

Tigst Demeke works for the Canadian Grain Commission as a research scientist. He received his Ph.D. from Colorado State University in horticulture, specializing in tissue culture. Tigsts current research focuses on detection and identification of genetically engineered grains and oilseeds. He also collaborates with the Grain Research Laboratorys Microbiology program on the use of DNA-based molecular markers for identification and characterization of pathogens.