alexa High-Quality Mesh Deformation Using Quaternions for Orthogonality Preservation


Journal of Physical Mathematics

Author(s): Daigo Maruyama, Didier Bailly, Grald Carrier

Abstract Share this page

Many mesh deformation techniques developed in the past have been widely used, but for large deformations, the mesh properties can be severely altered. In particular, the mesh lines orthogonality near the boundaries can be lost. In this paper, a method initially proposed by Samareh (“Application of Quaternions for Mesh Deformation,” NASA TM-2002-211646, April 2002) is developed to overcome this limitation and to provide a high-quality mesh-orthogonality preservation technique. Each node displacement is composed of a translation vector and a quaternion, which takes into account local mesh rotations. Algebraic unitary quaternion properties (Lie group algebra) are used to obtain a robust interpolation method. Two quaternion interpolation methods are compared, respectively: the spherical linear interpolation, and the Lie algebra linear interpolation. Furthermore, thanks to a new process (transformation division), the method becomes independent of the rotation center used. The accuracy and generality of the method is significantly improved by this new process, and different test cases (two-dimensional and three-dimensional) are presented to illustrate the benefits obtained. Global mesh quality is shown to be preserved, especially local mesh orthogonality near the moving surfaces. The application to an iced airfoil shows the capability of the method to propagate very severe deformations while providing deformed mesh that enables accurate Reynolds-averaged Navier–Stokes computational fluid dynamics calculations.

This article was published in AIAA Journal, Vol. 52 and referenced in Journal of Physical Mathematics

Relevant Expert PPTs

Relevant Speaker PPTs

Peer Reviewed Journals
Make the best use of Scientific Research and information from our 700 + peer reviewed, Open Access Journals
International Conferences 2017-18
Meet Inspiring Speakers and Experts at our 3000+ Global Annual Meetings

Contact Us

© 2008-2017 OMICS International - Open Access Publisher. Best viewed in Mozilla Firefox | Google Chrome | Above IE 7.0 version