alexa Structural characterization of Bi2-xSbxS3 films prepared by the dip-dry method.
Materials Science

Materials Science

Research & Reviews: Journal of Material Sciences

Author(s): BB Nayak, HN Acharya, GB Mitra, BK Mathur

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A solid solution of Bi2S3Sb2S3 was prepared in the form of polycrystalline films on glass substrates by the dip-dry process using BiCl3, SbCl3 concentrated hydrochloric acid and thiourea. Structural characterization of the material Bi2−xSbxS3 was carried out by the X-ray powder diffraction method and polarography. While the lattice constants a0 and b0 were found to increase with increasing mole fraction x of antimony in the solid solution, c0 decreased almost monotonically with increasing x. Vegard's law is obeyed in the whole domain from x = 0 to x = 2.

This article was published in Thin Solid Film and referenced in Research & Reviews: Journal of Material Sciences

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