alexa Abstract | Card Setting: A Factor for Controlling Sliver Quality and Yarn
ISSN: 2165-8064

Journal of Textile Science & Engineering
Open Access

OMICS International organises 3000+ Global Conferenceseries Events every year across USA, Europe & Asia with support from 1000 more scientific Societies and Publishes 700+ Open Access Journals which contains over 50000 eminent personalities, reputed scientists as editorial board members.

Open Access Journals gaining more Readers and Citations

700 Journals and 15,000,000 Readers Each Journal is getting 25,000+ Readers

This Readership is 10 times more when compared to other Subscription Journals (Source: Google Analytics)

Review Article Open Access

Abstract

In carding different organs revolved at different speed which was impact on sliver quality. Fiber opened with blow room fed to Card in the small tuft form and furthers it open again and individualization of fiber takes place in between cylinder and flats, finally fibers were converted into sliver form. In order to obtain better sliver quality the setting parameters of card and machinery condition plays important role, small deviation in machine setting parameter and speeds leads to produce inferior sliver quality The Neps is a undesirable factor which reduce the quality of the yarn and ultimately reduces the cost of the final products, In order to reduce the neps and improvement in card sliver quality an experiment trials were conducted at carding on DK760 Trutzschler card by changing setting of cylinder and flat, cylinder to doffer respectively. Carded material processed separately till Ring frame stage for 24.60 Tex (24 Ne), to determine yarn quality in spinning, adopted for large-scale working in spinning department

To read the full article Peer-reviewed Article PDF image | Peer-reviewed Full Article image

Author(s): Abdul Salaam A Bagwan and Kailas Jadhav

Keywords

Cylinder to flat setting, Cylinder to doffer setting, Thick place, Thin place, Neps, Rkm.Neps +200%, Cylinder to flat setting, Cylinder to doffer setting, Thick place, Thin place, Neps, Rkm.Neps +200%

Share This Page

Additional Info

Loading
Loading Please wait..
 
 
 
Peer Reviewed Journals
 
Make the best use of Scientific Research and information from our 700 + peer reviewed, Open Access Journals
International Conferences 2017-18
 
Meet Inspiring Speakers and Experts at our 3000+ Global Annual Meetings

Contact Us

 
© 2008-2017 OMICS International - Open Access Publisher. Best viewed in Mozilla Firefox | Google Chrome | Above IE 7.0 version
adwords