Currently, atomic force microscopy (AFM) is widely used by many researchers from around the world in materials science applications. Why? Before answering the question, let us look at the history of atomic force microscopy quickly. The precursor to the AFM was developed by Gerd Binnig and Heinrich Rohrer in the early 1980 at IBM Research-Zurich. However, Binnig was invented the AFM and the first experimental implementation was made by Binnig, Quate and Gerber in 1986. Nowadays, we can observe that the number of publications making use of atomic force microscopy in order to study the topography of materials has increased from time to time. There are several advantages of using the atomic force microscopy in terms of research activities such as to investigate the film thickness, to obtain surface roughness, to imaging surfaces with nanometer resolution, to measure the size of the particles, to observe grain size distribution and to view the two-dimensional & three-dimensional images.