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International Journal of Microscopy

International Journal of Microscopy

Atomic force microscopy

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Atomic force microscopy

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Atomic Force Microscopy (AFM) provides a 3D structure of the surface in nano scale which is less than 10nm. AFM consists of a cantilever with a small tip (probe) at the free end, a laser, a 4-quadrant photodiode and a scanner. The tip of the AFM touches the surface and records the small force between the probe and the surface. AFM is the most common form of scanning probe microscopy which is used in the fields of chemistry, biology, physics, materials science, nanotechnology, astronomy, medicine and more.

Related journals of Atomic force microscopy Journal of the Royal Society Interface, Journal of Nanotechnology, Italian Journal of Anatomy and Embryology, Physical Chemistry Chemical Physics, Journal of Bacteriology, Journal of Nanobiotechnology

Atomic force microscopy

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