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International Journal of Microscopy
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Backscatter electrons

When an electron beam strikes a sample a large number of signals are generated, many of the incident electrons will be scattered inside the sample resulting repeated collisions with the atomic core and electrons that compose the sample, until they lose their energy inside sample. Secondary and backscattered electrons are two types of electron which are used to produce an image in a scanning electron microscope.

Related journals of Backscatter electrons Journal of Physics E: Scientific Instruments, Ultramicroscopy, Journal of Applied Physics, International Journal of Modern Physics B, International Journal of Radiation Oncology • Biology • Physics, Journal of Petrology, Microscopy and Microanalysis

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