Open Access Journals gaining more Readers and Citations
700 Journals and 15,000,000 Readers Each Journal is getting 25,000+ Readers
Kelvin probe force microscopy is an atomic force microscopy based technique that is used to measure contact potential difference between the probe and the sample. It enables high resolution surface potential and topography mapping of a variety of sample.
Related journals of Kelvin probe force microscopy Japanese Journal of Applied Physics, Journal of Nanotechnology, Journal of Physical Chemistry, Journal of Applied Physics, Journal of Materials Chemistry A