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International Journal of Microscopy
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Scanning Probe Microscopy

Scanning probe microscopy is a branch of microscopy that forms three dimensional images of surfaces and structures using a physical probe that scans the specimen. During the process of scanning, a computer collects the data that are used to provoke an image of the surface. Antoni van Leeuwenhoek was the first person to study the microscopic world. There are several types of SPMs. Atomic force microscopes , Magnetic force microscopes , and Scanning tunneling microscopes.

Related journals of Scanning Probe Microscopy Journal of Scanning Probe Microscopy; Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films; Scanning Probe Microscopy of Serpin Polymers

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