alexa
Reach Us +44-1625-708989
Scanning Probe Microscopy | List of High Impact Articles | PPts | Journals | Videos
International Journal of Microscopy

International Journal of Microscopy

Scanning Probe Microscopy

Search results for
Scanning Probe Microscopy

OMICS International organises 3000+ Global Conferenceseries Events every year across USA, Europe & Asia with support from 1000 more scientific Societies and Publishes 700+ Open Access Journals which contains over 50000 eminent personalities, reputed scientists as editorial board members.

Scanning probe microscopy is a branch of microscopy that forms three dimensional images of surfaces and structures using a physical probe that scans the specimen. During the process of scanning, a computer collects the data that are used to provoke an image of the surface. Antoni van Leeuwenhoek was the first person to study the microscopic world. There are several types of SPMs. Atomic force microscopes , Magnetic force microscopes , and Scanning tunneling microscopes.

Related journals of Scanning Probe Microscopy Journal of Scanning Probe Microscopy; Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films; Scanning Probe Microscopy of Serpin Polymers

Scanning Probe Microscopy

Expert PPTs

Speaker PPTs