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International Journal of Microscopy
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Transmission electron microscopy

Transmission electron microscopy is a microscopy technique in which a high-energy electron beam is transmitted through a thin specimen to form an image. Images generally contain contrast due to atomic mass, crystallinity, or thickness variations within the sample. In virology, materials science and cancer research, and as well as pollution, nanotechnology and semiconductor research, Transmission electron microscopy is used.

Related journals Transmission electron microscopy Ultramicroscopy, The Journal of Physical Chemistry, Journal of Experimental Biology, Journal of Physics: Conference Series, Journal of Applied Physics, Journal of Vacuum Science and Technology

Transmission electron microscopy

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