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International Journal of Microscopy

International Journal of Microscopy

Scanning electron microscope

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Scanning electron microscope

OMICS International organises 3000+ Global Conferenceseries Events every year across USA, Europe & Asia with support from 1000 more scientific Societies and Publishes 700+ Open Access Journals which contains over 50000 eminent personalities, reputed scientists as editorial board members.

Scanning electron microscope (SEM) is a microscope that works by scanning a focused beam of electrons on a sample of interest. The high-resolution and three-dimensional images produced by SEM provide morphological, compositional, and topographical information which makes them applicable in fields of science and industry.

Related journals Scanning electron microscope Journal of Health & Medical Informatics, Journal of Chemical Education, Journal of Engineering Materials and Technology, Journal of the Royal Society Interface, Journal of Macromolecular Science, Optics and Lasers, Scanning

Scanning electron microscope

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