Our Group organises 3000+ Global Conferenceseries Events every year across USA, Europe & Asia with support from 1000 more scientific societies and Publishes 700+ Open Access Journals which contains over 50000 eminent personalities, reputed scientists as editorial board members.
Currently, atomic force microscopy (AFM) is widely used by many researchers from around the world in materials science applications. Why? Before answering the question, let us look at the history of atomic force microscopy quickly. The precursor to the AFM was developed by Gerd Binnig and Heinrich Rohrer in the early 1980 at IBM Research-Zurich. However, Binnig was invented the AFM and the first experimental implementation was made by Binnig, Quate and Gerber in 1986. Nowadays, we can observe that the number of publications making use of atomic force microscopy in order to study the topography of materials has increased from time to time. There are several advantages of using the atomic force microscopy in terms of research activities such as to investigate the film thickness, to obtain surface roughness, to imaging surfaces with nanometer resolution, to measure the size of the particles, to observe grain size distribution and to view the two-dimensional & three-dimensional images.
Citation: Soonmin (2015) The Applications of Atomic Force Microscopy in Materials Science Research. Chem Sci J 6:e107. doi: 10.4172/2150-3494.1000e107
Spanish 
Chinese 
Russian 
German 
French 
Japanese 
Portuguese 
Hindi