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The inverse scattering problem consists of determining characteristics of an object (viz.,its shape and internal constitution) based on its scattering data when it isilluminated by incident waves. In many real world applications, imaging via inverse scattering is desired. For example, when sensor is far from object, or when barriers are present between sensor and object. Different from direct imaging (or physical imaging), such as images appearing in film and charge coupled device (CCD), which displays the intensity of electromagnetic wave in a two-dimensional plane, inverse scattering approach provides reconstructed images, which is able to display three-dimensional information (viz., geometrical and optical properties) of an object...... Read More.......
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