alexa Power Optimisation of Scan Based IC Testing
ISSN ONLINE(2278-8875) PRINT (2320-3765)

International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering
Open Access

OMICS International organises 3000+ Global Conferenceseries Events every year across USA, Europe & Asia with support from 1000 more scientific Societies and Publishes 700+ Open Access Journals which contains over 50000 eminent personalities, reputed scientists as editorial board members.

Open Access Journals gaining more Readers and Citations

700 Journals and 15,000,000 Readers Each Journal is getting 25,000+ Readers

This Readership is 10 times more when compared to other Subscription Journals (Source: Google Analytics)

Research Article

Power Optimisation of Scan Based IC Testing

B.BalaBhuvanapriya1, S.Janani1
  1. PG Student [VLSI], Department of ECE, Sri Eshwar College of Engineering, Coimbatore, Tamilnadu, India
Related article at Pubmed, Scholar Google
 

Abstract

In this paper, the main aim of this project is design the low power VLSI technology. The reason for the power dissipation is switching activity in the circuit. In base paper they used Dual Mode One Latch Double Edge Triggered Scan flop for reducing the switching activity. If switching activity reduces means the power dissipation will also reduce. Scan flop is nothing but combination of D-Flip flop and Multiplexer. The scan flops are combining with shift register to form a scan chain. The scan chains are used to make the testing operation in easy manner. Dual mode one latch double edge triggered is used to reduce the multi cycle path constraints. Due to the reduction of switching activity the power dissipation and time delay will reduce. But this method is older. Nowadays lot of technologies is invented. From that two methods are used. One is Gated logic circuit and Precomputation method. In Gated logic method the AND gate will be use in scan flop for reducing the power effectively. And in precomputation method comparators are used with scan chain.

Keywords

Share This Page

Additional Info

Loading
Loading Please wait..
Peer Reviewed Journals
 
Make the best use of Scientific Research and information from our 700 + peer reviewed, Open Access Journals
International Conferences 2017-18
 
Meet Inspiring Speakers and Experts at our 3000+ Global Annual Meetings

Contact Us

 
© 2008-2017 OMICS International - Open Access Publisher. Best viewed in Mozilla Firefox | Google Chrome | Above IE 7.0 version
adwords