alexa Test the S27 Benchmark Circuit by Using Built In Self
ISSN ONLINE(2278-8875) PRINT (2320-3765)

International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering
Open Access

OMICS International organises 3000+ Global Conferenceseries Events every year across USA, Europe & Asia with support from 1000 more scientific Societies and Publishes 700+ Open Access Journals which contains over 50000 eminent personalities, reputed scientists as editorial board members.

Open Access Journals gaining more Readers and Citations

700 Journals and 15,000,000 Readers Each Journal is getting 25,000+ Readers

This Readership is 10 times more when compared to other Subscription Journals (Source: Google Analytics)

Research Article

Test the S27 Benchmark Circuit by Using Built In Self Test and Test Pattern Generation

S.Nagaraju1, Ch.N.L.Sujatha2, J.S.S.Ramaraju3
  1. M.Tech ECE Pursuing, Bhimavaram Institute of Engineering & Technology, West Godavari, A.P, India
  2. Assistant Professor, Department of ECE, Bhimavaram Institute of Engineering & Technology, West Godavari, A.P, India
  3. Assistant Professor, Department of ECE, Bhimavaram Institute of Engineering & Technology(BVRM), West Godavari,A.P, India
Related article at Pubmed, Scholar Google
 

Abstract

In the proposed method we are test the S27 sequential circuit by using Built in Self Test.This paper describes an on-chip test generation method for functional broadside tests. The hardware was base on the application of primary input sequences initial from a well-known reachable state, therefore using the circuit to produce additional reachable states. Random primary enter sequences were changed to avoid repeated synchronization and thus defer varied sets of reachable states. Functional broadside tests are two-pattern scan based tests that avoid over testing by ensuring that a circuit traverses only reachable states in the functional clock cycles of a check. These consist of the input vectors and the equivalent responses. They check for proper operation of a verified design by testing the internal chip nodes. Useful tests cover a very high percentage of modeled faults in logic circuits and their generation is the main topic of this method. Often, functional vectors are understood as verification vectors, these are used to verify whether the hardware actually matches its specification. Though, in the ATE world, any one vectors applied are understood to be functional fault coverage vectors applied during developing test. This paper show the on chip test Generation for a bench mark circuit using simple fixed hardware design with small no of parameters altered in the design for the generation of no of patterns. If the patterns of the input test vector results a fault simulation then circuit test is going to fail.

Share This Page

Additional Info

Loading
Loading Please wait..
Peer Reviewed Journals
 
Make the best use of Scientific Research and information from our 700 + peer reviewed, Open Access Journals
International Conferences 2017-18
 
Meet Inspiring Speakers and Experts at our 3000+ Global Annual Meetings

Contact Us

Agri, Food, Aqua and Veterinary Science Journals

Dr. Krish

[email protected]

1-702-714-7001 Extn: 9040

Clinical and Biochemistry Journals

Datta A

[email protected]

1-702-714-7001Extn: 9037

Business & Management Journals

Ronald

[email protected]

1-702-714-7001Extn: 9042

Chemical Engineering and Chemistry Journals

Gabriel Shaw

[email protected]

1-702-714-7001 Extn: 9040

Earth & Environmental Sciences

Katie Wilson

[email protected]

1-702-714-7001Extn: 9042

Engineering Journals

James Franklin

[email protected]

1-702-714-7001Extn: 9042

General Science and Health care Journals

Andrea Jason

[email protected]

1-702-714-7001Extn: 9043

Genetics and Molecular Biology Journals

Anna Melissa

[email protected]

1-702-714-7001 Extn: 9006

Immunology & Microbiology Journals

David Gorantl

[email protected]

1-702-714-7001Extn: 9014

Informatics Journals

Stephanie Skinner

[email protected]

1-702-714-7001Extn: 9039

Material Sciences Journals

Rachle Green

[email protected]com

1-702-714-7001Extn: 9039

Mathematics and Physics Journals

Jim Willison

[email protected]

1-702-714-7001 Extn: 9042

Medical Journals

Nimmi Anna

[email protected]

1-702-714-7001 Extn: 9038

Neuroscience & Psychology Journals

Nathan T

[email protected]

1-702-714-7001Extn: 9041

Pharmaceutical Sciences Journals

John Behannon

[email protected]

1-702-714-7001Extn: 9007

Social & Political Science Journals

Steve Harry

[email protected]

1-702-714-7001 Extn: 9042

 
© 2008-2017 OMICS International - Open Access Publisher. Best viewed in Mozilla Firefox | Google Chrome | Above IE 7.0 version
adwords