alexa Abstract | Dynamic Shift Scan with Area Efficiency
ISSN ONLINE(2278-8875) PRINT (2320-3765)

International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering
Open Access

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Research Article Open Access


Sequential circuit testing is more effective if it is done using dynamic shift scan method. Again the testing of sequential circuits can be done in minimum clock cycles by using a cycle cycle access with hold mode. Here the advantage is it reduces the clock cycles and the problem is it increases the hardware. The percentage of utilization again can be reduce by the modification of scan cells. Each scan cells can be change to single cycle access without hold mode. It reduces the clock cycles and reduces the area utilization also.

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Sequential Circuits, Single Cycle Access, Scan Cells, Testing Time, Electronic Materials, Optical Communication, Electric Drivers and Application.

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