alexa Abstract | Microcontroller and SD Card Based Standalone Data Logging System using SPI and I2C Protocols for Industrial Application
ISSN ONLINE(2278-8875) PRINT (2320-3765)

International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering
Open Access

OMICS International organises 3000+ Global Conferenceseries Events every year across USA, Europe & Asia with support from 1000 more scientific Societies and Publishes 700+ Open Access Journals which contains over 50000 eminent personalities, reputed scientists as editorial board members.

Open Access Journals gaining more Readers and Citations

700 Journals and 15,000,000 Readers Each Journal is getting 25,000+ Readers

This Readership is 10 times more when compared to other Subscription Journals (Source: Google Analytics)

Research Article Open Access

Abstract

The low cost micro SD card based Data Logging System (DLS) for the measurement of parameters such as temperature, load current, load voltage and power have been designed and developed. These parameters are the time varying signals that are sensed by respective sensors. The sensor values are read by on-chip ADC and it is used for further process. The micro secured digital (SD) card is interfaced with PIC18F45K22 microcontroller in Serial Peripheral Interface (SPI) mode of Master Synchronous Serial Port (MSSP) for DLS design. The RTC is also interfaced to the microcontroller using I2C protocol to provide time stamping. The designed DLS has been tested with the application program developed in MPLAB X IDE which can write data into SD card at the rate of 5 samples / second.

To read the full article Peer-reviewed Article PDF image

Author(s): M. B. Satheesh, B. Senthilkumar, T. Veeramanikandasamy, O. M. Saravanakumar

Keywords

Data Logging System, Load current and voltage, PIC microcontroller, microSD card, SPI, RTC, I2C., Electronic Materials, Optical Communication, Electric Drivers and Application.

Share This Page

Additional Info

Loading
Loading Please wait..
 
 
Peer Reviewed Journals
 
Make the best use of Scientific Research and information from our 700 + peer reviewed, Open Access Journals
International Conferences 2017-18
 
Meet Inspiring Speakers and Experts at our 3000+ Global Annual Meetings

Contact Us

 
© 2008-2017 OMICS International - Open Access Publisher. Best viewed in Mozilla Firefox | Google Chrome | Above IE 7.0 version
adwords