As per available reports about 124 journals, 87 Conferences, 102 workshops are presently dedicated exclusively to Material Thickness and about 148030 articles are being published on the current trends in Material Thickness. In terms of research annually, USA, India, Japan, Brazil and Canada are some of the leading countries where maximum studies related to Material Thickness are being carried out. The distance between the top and bottom or front and back surfaces of layer of a material (thin film) of is called Thickness. As reported in “The determination of thin film thickness using reflectance spectroscopy” by Hind and Chomette, Thin films, layers of one material deposited on another material, are significant in many high-technology industries. The characterization of thin films is extremely important in many optics/photonics applications like semiconductor, micro-machining, defence, architectural glass and flat panel displays, with parameters of interest including film thickness, refractive index, coating homogeneity and reflectivity.
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List of major related journals on Thickness
List of major Societies on the Thickness
List of major workshops on the Thickness
|This page will be updated regularly.|
|This page was last updated on 03thJanÂ 2017|