Total Reflection X-Ray Fluorescence Spectroscopy to Evaluate Heavy Metals Accumulation in Legumes
- *Corresponding Author:
- Laura Borgese
Dipartimento di Ingegneria Meccanicae
Industriale Via Branze 38, 25 123 Brescia, Italy
E-mail: [email protected]
Received Date: Novmber 24, 2015; Accepted Date: December 16, 2015; Published Date: December 23, 2015
Citation: Bilo F, Borgese L, Zacco A, Lazo P, Zoani C, et al. (2015) Total Reflection X-Ray Fluorescence Spectroscopy to Evaluate Heavy Metals Accumulation in Legumes. by HPTLC Method. J Anal Bioanal Tech 7:292. doi:10.4172/2155-9872.1000292
Copyright: © 2015 Bilo F, et al. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
This work is to demonstrate the usefulness of total reflection X-ray fluorescence (TXRF) for fast and reliable quantitative analysis of heavy metals in plants used for accumulation studies. A model study of beans germination in lead contaminated environment under controlled laboratory conditions was realized. Metal accumulation in different parts of the plant was evaluated. Two different sample preparation procedures for TXRF analysis were considered: microwave acid digestion and direct analysis of suspended powdered sample. Quantitative determination of macro, micro, and trace elements was performed. Root showed the highest accumulation of lead, followed by stem, leaves and crops. Results showed that direct analysis of suspended powdered samples may be used as a fast and simple method for screening.