A Review on Theoretical Studies of Optical and Electrical Parameters Values of Thin films | OMICS International| Abstract
ISSN: 2168-9806

Journal of Powder Metallurgy & Mining
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  • Review Article   
  • J Powder Metall Min 2017, Vol 6(3): 177
  • DOI: 10.4172/2168-9806.1000177

A Review on Theoretical Studies of Optical and Electrical Parameters Values of Thin films

Ayeshamariam A1,2,3*, Karunanithy M1,4, Thirumamagal R1, Nivetha S2,3, Kavin MM2,3, Geetha N1 and Jayachandran M5
1Research and Development Centre, Bharathidasan University, Thiruchirappalli, 620 024, India
2Research and Development Centre, Bharathiyar University, Coimbatore, 641 046, India
3Department of Physics, Khadir Mohideen College, , Adirampattinam, 614 701, India
4Department of Physics, SKPD College, , Chennai, 600 001, India
5Department of Physics, Sethu Institute of Technology, , Pullor, Kariyapatti, 626 106, India
*Corresponding Author : Ayeshamariam A, Research and Development Centre, Bharathidasan University, Thiruchirappalli And Coimbatore, India, Tel: 9486738806, Email: [email protected]

Received Date: Oct 03, 2017 / Accepted Date: Oct 07, 2017 / Published Date: Dec 15, 2017


This article provides an overview of research on nanoparticles quantum confinement processing of nanoparticles and processing applications in theoretical concepts of optical and electrical studies. The main text of this review is organized into two sections. Section 1 discusses the use of optical methods for the applications of nanoparticles and its model exciton properties of nanostructured particles and in section 2 discusses for dispersion of agglomerated nanoparticles and its various equations for all, such as photo luminescent and transparent conductive materials. These studies explain the theoretical equations of both nanoparticles and thin film.

Keywords: Exciton; Luminescent; Bohr radius; Complex impedence spectroscopy (CIS)

Citation: Ayeshamariam A, Karunanithy M, Thirumamagal R, Nivetha S, Kavin MM, et al. (2017) A Review on Theoretical Studies of Optical and Electrical Parameters Values of Thin films. J Powder Metall Min 6: 177. Doi: 10.4172/2168-9806.1000177

Copyright: © 2017 Ayeshamariam A, et al. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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