Editor - Xinqiang Yan | Vanderbilt University | 26302

OMICS Journal of Radiology
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Xinqiang Yan

Xinqiang Yan
Xinqiang Yan
Radiology and Institute of Imaging Science
Vanderbilt University
Vanderbilt University


Dr. Yan received the Ph.D. degree in particle physics and nuclear physics from the Institute of High Energy Physics, Chinese Academy of Sciences in 2014. He joined the Radiofrequency Group of the Institute of Biophysics, Chinese Academy of Sciences in 2011, where he developed RF coils and RF/analog circuits for the commercial Siemens 7-T MR scanner and the project to construct the first 9.4-T human MRI system of China. He joined Vanderbilt University Institute of Imaging Science (VUIIS, Nashville, TN, USA) as a Postdoctoral Research Fellow in 2014 under the supervision of Dr. William Grissom and Dr. John Gore, and later joined the core faculty in 2016.

Research Interest

Dr. Yan's research interests are in the area of magnetic resonance imaging, especially about the RF hardware and other technologies towards faster imaging and better imaging homogeneity at high fields.