Editor - Dong ZhiLi | Nanyang Technological University | 25270

International Journal of Microscopy
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Dong ZhiLi

Dong ZhiLi
Dr. Dong ZhiLi Associate Professor Nanyang Technological University, Singapore
Nanyang Technological University


Dr ZhiLi Dong received his BEng and PhD degrees from Tsinghua University, China. Dong completed his PhD thesis at Tsinghua University and Osaka University under the Joint PhD Program of Ministry of Education of China. Dong was trained as a materials engineer and scientist during his undergraduate and postgraduate study at Tsinghua University China and Osaka University Japan. He subsequently developed his research in the areas of materials engineering, crystal structure/electronic structure-property relationships, and interface structure analysis. He has about thirty years experience in x-ray diffraction and transmission electron microscopy of materials. Dong’s teaching is mainly focused on (1) metallic and ceramics materials, and (2) crystallography, X-ray diffraction and transmission electron microscopy of materials. Prior to joining the School of Materials Science & Engineering of Nanyang Technological University, Dong worked at the Environmental Technology Institute of Singapore as a senior research scientist, School of Mechanical and Production Engineering of NTU as a research fellow, University of Barcelona as a visiting professor, and Tsinghua University as a lecturer.

Research Interest

Processing of metals and alloys; Synthesis of geo-mimetic ceramic powders; Functionalities and applications of geo-mimetic ceramic materials (including apatite-type, perovskite-type, spinel-type, wurtzite-type, anatase-type, olivine-type, and layered-type); Applications of polyoxometalates; X-ray diffraction and transmission electron microscopy of metals and ceramics; Coating and cross-sectional interface structure analysis by TEM/EELS; Crystal structure / Electronic structure -- property relationships .